OPTICAL QUALITY CONTROL FOR ADAPTIVE POLISHING PROCESSES

Kategorien Konferenz (reviewed)
Jahr 2020
Autoren Kassubeck, M., Malek, T., Mühlhausen, M., Kappel, M., Castillo, S., Dittrich, M.-A., Magnor, M.:
Veröffentlicht in SSIAI 2020, March 29th - March 31st, 2020, Santa Fe, New Mexico, US, S. 90-94.
Beschreibung

We propose an image-based method to automatically estimate the surface roughness of a polishing process carried out by a numerically controlled machine tool. Given a single photograph of the workpiece, we incorporate techniques from differentiable rendering to infer the object’s roughness parameters, resulting in several advantages over existing approaches: since the method fully accounts for global light transport effects, the estimation can occur under general, known lighting conditions and workpiece geometries. This allows deployment of our approach for in-situ measurements by simply equipping the machine tool with a standard digital camera capturing photos of the workpiece. We investigate the feasibility and effectiveness of our novel method in a prototype application considering polished brass plates. Our results demonstrate a promising direction for surface parameter measurement in less restricted polishing process environments.