ForschungPublikationen
OPTICAL QUALITY CONTROL FOR ADAPTIVE POLISHING PROCESSES

OPTICAL QUALITY CONTROL FOR ADAPTIVE POLISHING PROCESSES

Kategorien Konferenz (reviewed)
Jahr 2020
Autoren Kassubeck, M., Malek, T., Mühlhausen, M., Kappel, M., Castillo, S., Dittrich, M.-A., Magnor, M.:
Veröffentlicht in SSIAI 2020, March 29th - March 31st, 2020, Santa Fe, New Mexico, US, S. 90-94.
Beschreibung

We propose an image-based method to automatically estimate the surface roughness of a polishing process carried out by a numerically controlled machine tool. Given a single photograph of the workpiece, we incorporate techniques from differentiable rendering to infer the object’s roughness parameters, resulting in several advantages over existing approaches: since the method fully accounts for global light transport effects, the estimation can occur under general, known lighting conditions and workpiece geometries. This allows deployment of our approach for in-situ measurements by simply equipping the machine tool with a standard digital camera capturing photos of the workpiece. We investigate the feasibility and effectiveness of our novel method in a prototype application considering polished brass plates. Our results demonstrate a promising direction for surface parameter measurement in less restricted polishing process environments.