Autonomous Modular Process Monitoring
Kategorien |
Vortrag |
Jahr | 2016 |
Autoren | Denkena, B., Dahlmann, D., Neff, T.: |
Veröffentlicht in | 3rd International Conference on System-integrated Intelligence: New Challenges for Product and Production Engineering, SysInt 2016, 13. - 15.06.2016, Paderborn, 25 Seiten. |